Abstract

With the improvement of quality requirements of optical components, the detection of subsurface defects of optical components has become a key technology. The existing detection methods still have some limitations in detection depth and detection efficiency. In this paper, a defect scattering light collection method based on ellipsoidal mirror model is used to analyze the scattering light collection efficiency under different experimental conditions theoretically, and the favorable conditions for improving the scattering light collection are proposed. After simulation verification, the use of ellipsoidal reflectors to collect scattered light can effectively avoid the impact of surface defects compared to lenses. At the same time, an experimental system based on this method is set up to filter the stray light by mean filtering method. The system detected three scratches (2 μm in width and 252 nm in depth) on the underside of a piece of quartz glass. The results show that the system can clearly detect the subsurface defects of optical components.

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