Abstract

The paper describes the design and performance of an electrostatically scanned film reflector. A drive scan sensitivity of better than a wavelength per volt at 6328 Å can be achieved with the use of appropriate polarization voltages. The power requirements for both polarization and drive may be made extremely low. In addition the device is capable of good optical properties together with large linear displacements. It should find wide application in interferometer and laser systems, particularly in the infrared region of the spectrum.

© 1972 Optical Society of America

Laser Interferometers for Measuring Displacements and Determining Object Positions

V. P. Koronkevitch, G. A. Lenkova, A. M. Tsherbatchenko, A. I. Lokhmatov, V. P. Kiryanov, B. G. Matienko, and V. P. Golubkova
Appl. Opt. 11(2) 359-361 (1972)

Scanned-Laser Microscope for Photoluminescence Studies

J. F. Black, C. J. Summers, and B. Sherman
Appl. Opt. 11(7) 1553-1562 (1972)

High Resolution Michelson Interferometer for Spectral Investigations of Lasers

H. Welling and B. Wellegehausen
Appl. Opt. 11(9) 1986-1990 (1972)

Measurement of Particle Size, Number Density, and Velocity Using a Laser Interferometer

W. M. Farmer
Appl. Opt. 11(11) 2603-2612 (1972)

White-Light Interferometric Thickness Gauge

P. A. Flournoy, R. W. McClure, and G. Wyntjes
Appl. Opt. 11(9) 1907-1915 (1972)