Abstract

A Ronchi ruling is photographed through a phase object that deforms the grating lines. The object is displaced longitudinally, and a second exposure is made. After developing, the photographic plate is observed with a frequency-plane mask that cuts off all but one of the diffracted orders. A lateral-shear interferogram of the phase object is obtained in this way. The experiment may be carried out by making multiple exposures and by displacing the object through equal distances after each exposure. This will produce a multiple-beam lateral-shear interferogram, and the fringes become very sharp.

© 1973 Optical Society of America

Double Frequency Grating Lateral Shear Interferometer

J. C. Wyant
Appl. Opt. 12(9) 2057-2060 (1973)

Multiple-beam lateral shear interferometry for optical testing

R. S. Sirohi, T. Eiju, K. Matsuda, and T. H. Barnes
Appl. Opt. 34(16) 2864-2870 (1995)

Tilted-Reference-Beam Lateral Shearing Interferometer Utilizing Carrier-Frequency Photography

Yie-Ming Hong
Appl. Opt. 14(3) 614-617 (1975)

Laser beam divergence utilizing a lateral shearing interferometer

M. E. Riley and M. A. Gusinow
Appl. Opt. 16(10) 2753-2756 (1977)

Talbot Interferometer for Radial and Lateral Derivatives

Donald E. Silva
Appl. Opt. 11(11) 2613-2624 (1972)