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Measurement of Low-Field Faraday Rotation and Ellipticity

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Abstract

A convenient measurement technique for Faraday rotation is extended to include the effect of ellipticity. The measurement theory is presented, and a procedure for determining the correction for the rotation measurement is explained. Also, a simple test to determine whether ellipticity is an important factor and the means for deducing ellipticity when the rotation is known are described. A graphical representation of the effect of ellipticity on the measurement as a function of minor-to-major axes ratio is included.

© 1974 Optical Society of America

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