Abstract

In the method described, two coherent light beams are directed at the partially transmitting film in such a way that two new beams are emitted. A comparison between the intensities of the outgoing beams enables one to determine the thickness, refractive index, and absorption coefficient of the film. One advantage of the method is that no absolute values of light intensities or polarization must be determined. This part of the work describes the basic theory of the new method. Experimental verification of the theory and further analysis of the characteristics of the method are left for Part 2.

© 1975 Optical Society of America

Optical parameters of partially transmitting thin films. 2: Experiment and further analysis of a novel method for their determination

J. Shamir
Appl. Opt. 15(1) 120-126 (1976)

Combined reflection and transmission thin-film ellipsometry: a unified linear analysis

R. M. A. Azzam, M. Elshazly-Zaghloul, and N. M. Bashara
Appl. Opt. 14(7) 1652-1663 (1975)

Two-Film Reflection Polarizers: Theory and Application

M. Ruiz-Urbieta, E. M. Sparrow, and P. D. Parikh
Appl. Opt. 14(2) 486-492 (1975)

Far-infrared thin-film beam splitters: calculated properties

Donald R. Smith and Ernest V. Loewenstein
Appl. Opt. 14(10) 2473-2475 (1975)

Determination of thin film optical parameters from photometric measurements: an algebraic solution for the (T,R_f,R_b) method

Valentin Panayotov and Ivan Konstantinov
Appl. Opt. 30(19) 2795-2800 (1991)