Abstract

Optical waveguide parameters, guide index of refraction and thickness, can be measured from the knowledge of mode propagation constants at two different wavelengths. This method is as accurate as the two-mode method and can be used for both single-mode guides and multimode guides. The index of refraction of various optical components must be known at both the wavelengths; in cases where these indices are not directly available it is possible to interpolate this information from the known properties of other glasses. This paper describes the experimental and analytical aspects of the two-wavelength measurement technique.

© 1975 Optical Society of America

Explicit General Eigenvalue Solutions for Dielectric Slab Waveguides

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