Abstract

In Part 1 of this work a theory was developed for the measurement of the thickness, refractive index, and absorption coefficient of a partially transmitting thin film. In the present work, an experimental system is described and the basic theory verified by actual measurements. It is shown how the measurement of intensity ratios in a single setup is adequate for the determination of the above mentioned parameters. In addition, the application of the system for the examination of optical surface quality is demonstrated. Finally, the theory is extended to nonnormal incidence.

© 1976 Optical Society of America

Optical parameters of partially transmitting thin films. 1: Basic theory of a novel method for their determinations

J. Shamir and P. Gräff
Appl. Opt. 14(12) 3053-3056 (1975)

Infrared holography: an analysis of the thermal behavior of thin films

F. Matekunas, D. W. Sweeney, and W. H. Stevenson
Appl. Opt. 15(6) 1541-1549 (1976)

Weakly absorbing layers: interferometric determination of their optical parameters

Y. Demner and J. Shamir
Appl. Opt. 17(23) 3738-3745 (1978)

Determination of optical constants of absorbing materials using transmission and reflection of thin films on partially metallized substrates: analysis of the new (T,Rm) technique

A. Hjortsberg
Appl. Opt. 20(7) 1254-1263 (1981)

Lummer-Gehrcke interferometer modified for the spectroscopy of thin dielectric films

Cardinal Warde
Appl. Opt. 15(11) 2730-2735 (1976)