Abstract

A step-by-step procedure for the manufacture of Zernike disks and the design and fabrication of a laboratory Zernike test instrument are described. A laboratory wavefront error simulator is used to evaluate the low-order aberration measurement sensitivity of the Zernike test instrument. Measurement sensitivities were found to be better than λ/100 for all the low-order aberration types.

© 1977 Optical Society of America

Zernike test. 1: Analytical aspects

Lewis J. Golden
Appl. Opt. 16(1) 205-213 (1977)

Wavefront error simulator for evaluating optical testing instrumentation

L. J. Golden
Appl. Opt. 14(11) 2756-2761 (1975)

Dynamic Hartmann test

L. J. Golden
Appl. Opt. 14(10) 2391-2399 (1975)

Space and time variables in optics and holography: recent experimental aspects

Jean-Charles Viénot, Jean-Pierre Goedgebuer, and Alain Lacourt
Appl. Opt. 16(2) 454-461 (1977)

Experimental test of an infrared phase conjugation adaptive array*

C. L. Hayes, R. A. Brandewie, W. C. Davis, and G. E. Mevers
J. Opt. Soc. Am. 67(3) 269-277 (1977)