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Thin-film 2.8-μm and 3.8-μm absorption in single-layer films

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Abstract

A systematic study was made of thin-film absorption at 2.8 μm and 3.8 μm for a wide variety of transparent coating materials. The extinction and absorption coefficients were measured using HF/DF chemical laser calorimetry in single-layer films of PbF2, LiF, YbF3, NaF, ThF4, As2S3, As2Se3, Si, MgO, ZnSe, and Al2O3 on CaF2 substrates. The lowest absorbing film materials were the As glasses, ZnSe, and some fluorides. In these cases, high-purity starting material led to the lowest loss films.

© 1978 Optical Society of America

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