Abstract

The determination of the absorption of very weakly absorbing thin films and film systems is a difficult problem. In the present work a previously suggested method is generalized and improved in order to apply it for the determination of the absorption of films and multilayers. In the case of single layers, a single measurement is adequate to determine also the thickness and refractive index of the film. The main advantages of the method described here are its simplicity, its self-calibrating nature, and its high sensitivity to absorption.

© 1978 Optical Society of America

Determination of optical parameters and thickness of weakly absorbing thin films from reflectance and transmittance spectra

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Analytical method of determining optical constants of a weakly absorbing thin film

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