Abstract

The paper deals with the specular optical properties of thin dielectric or metallic multilayer coatings. Recurrent formulas are given for reflectance, transmittance, and their derivatives with respect to thicknesses, indices, incidence, and wavelength. Because of its simplicity and flexibility, the proposed method is particularly well fitted for use in a digital computer and for optimization programs.

© 1979 Optical Society of America

Derivatives of transmittance and reflectance for an absorbing multilayer stack

Ke-Ou Peng and Marcel R. de la Fonteijne
Appl. Opt. 24(4) 501-503 (1985)

Optical thin film production with continuous reoptimization of layer thicknesses

C. Holm
Appl. Opt. 18(12) 1978-1982 (1979)

Thin film optical coatings. 7: Two-layer coatings close to antireflection

J. Mouchart, J. Begel, and S. Chalot
Appl. Opt. 18(8) 1226-1232 (1979)

Reflectance, transmittance, and loss spectra of multilayer Si/SiO₂ thin film mirrors and antireflection coatings for 1.5 μm

J. Stone and L. W. Stulz
Appl. Opt. 29(4) 583-588 (1990)

Determination of optical constants of thin films and multilayer stacks by use of concurrent reflectance, transmittance, and ellipsometric measurements

Chubing Peng, Rongguang Liang, J. Kevin Erwin, Warren Bletscher, Kenichi Nagata, and Masud Mansuripur
Appl. Opt. 40(28) 5088-5099 (2001)