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Birefringence measurement using a photoelastic modulator

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Abstract

A high frequency photoelastic modulator is used to measure birefringence. A new method for determining large retardations is described and assessed. Its application permits the measurement of the numerical birefringence without the need to evaluate the fringe order number explicitly. Illustrative results obtained for quartz crystals are presented and discussed.

© 1979 Optical Society of America

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