Abstract

A geometric system for universal use in specifying and measuring retroreflectance is described. This system has been developed by the Subcommittee on Retroreflectance of CIE Committee 2.3 on Properties of Materials and is to be considered for adoption as part of a recommended practice.

© 1980 Optical Society of America

Chromaticity measurements of retroreflective material under nighttime geometry

J. J. Rennilson
Appl. Opt. 19(8) 1260-1267 (1980)

Factors affecting the metrology of retroreflecting materials

William H. Venable, H. F. Stephenson, and Heinz Terstiege
Appl. Opt. 19(8) 1242-1246 (1980)

Retroreflection measurements: a review

J. J. Rennilson
Appl. Opt. 19(8) 1234-1235 (1980)

NBS reference retroreflectometer

Kenneth L. Eckerle, Jack J. Hsia, Victor R. Weidner, and William H. Venable
Appl. Opt. 19(8) 1253-1259 (1980)

Retroreflectance measurements of photometric standards and coatings

W. G. Egan and T. Hilgeman
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