Abstract

Two dynamic interferometric techniques based on electrically tunable lasers are described and experimentally demonstrated. The first technique allows for measurements of small phase modulations in interferometers independently of dc drifts and low frequency noise in the interferometer. The second scheme is a true FM technique suited for continuous real-time noncontact measurements of the optical thickness of transparent materials.

© 1981 Optical Society of America

Single-beam diode-laser technique for optical path-length measurements

Clinton B. Carlisle, Russell E. Warren, and Haris Riris
Appl. Opt. 35(22) 4349-4354 (1996)

Infrared He–Xe laser interferometry for measuring length

Hirokazu Matsumoto
Appl. Opt. 20(2) 231-234 (1981)

Achieving variation of the optical path length by a few millimeters at millisecond rates for imaging of turbid media and optical interferometry: a new technique

Chin B. Su
Opt. Lett. 22(10) 665-667 (1997)

Absolute distance measurements by variable wavelength interferometry

F. Bien, M. Camac, H. J. Caulfield, and S. Ezekiel
Appl. Opt. 20(3) 400-403 (1981)

Measurement of changes in optical path length and reflectivity with phase-shifting laser feedback interferometry

Ben Ovryn and James H. Andrews
Appl. Opt. 38(10) 1959-1967 (1999)