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In-situ calibration technique for x-ray films

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Abstract

An in situ relative intensity calibration technique for x-ray films is described. This is based on film exposure measurements of an x-ray spectrum transmitted through a step-wedge absorption filter. As an example, characteristic curves for Kodak SC5 film have been obtained. The technique was used in the study of laser-produced plasmas.

© 1984 Optical Society of America

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