Abstract

The fringe orders in the channel spectrum of a thin film can be determined unambiguously, provided it is known that the film thickness is less than a critical value. This value is equal to minus one-half of the reciprocal dispersion of the material at the wavelength of minimum dispersion within the wavelength range of measurement. Values of critical thickness are given as a function of wavelength for 33 optical materials. The data indicate that the critical thickness is at least 10 μm in all the materials at wavelengths within the operating range of commercial spectrophotometers.

© 1984 Optical Society of America

Multiple determination of the optical constants of thin-film coating materials

D. P. Arndt, R. M. A. Azzam, J. M. Bennett, J. P. Borgogno, C. K. Carniglia, W. E. Case, J. A. Dobrowolski, U. J. Gibson, T. Tuttle Hart, F. C. Ho, V. A. Hodgkin, W. P. Klapp, H. A. Macleod, E. Pelletier, M. K. Purvis, D. M. Quinn, D. H. Strome, R. Swenson, P. A. Temple, and T. F. Thonn
Appl. Opt. 23(20) 3571-3596 (1984)

Measurement of the thickness and refractive index of a thin film by analyzing reflected interference fringes

Deok Woo Kim, Minjae Kwon, Soobong Park, Byoung Joo Kim, and Myoungsik Cha
Appl. Opt. 62(30) 8018-8024 (2023)

Determination of the absorption edge of a thin film from transmission measurements

Dan Goldschmidt
J. Opt. Soc. Am. A 1(3) 275-277 (1984)

Unambiguous determination of optical constants of absorbing films by reflectance and transmittance measurements

Ross C. McPhedran, Lindsay C. Botten, David R. McKenzie, and Roger P. Netterfield
Appl. Opt. 23(8) 1197-1205 (1984)

Modified channeled spectrum for fast measurement of thin films

G. Dyankov
Appl. Opt. 47(4) 536-540 (2008)