Abstract

Anistropic effects which depend on or are influenced by adsorbed moisture are discussed for films deposited at oblique incidence. Form birefringence reduces as water enters voids in a coating and the process of water transport is itself anisotropic. In some films water patches with an elliptical shape are formed during an early stage of the adsorption process. The distribution of optical radiation scattered from moisture patches in such a film is expected to be anisotropic. As metal–dielectric–metal filters were used in some of the observations, anisotropy of reflectance was investigated for both silver and aluminum.

© 1985 Optical Society of America

Measurement of the principal refractive indices of thin films deposited at oblique incidence

I. J. Hodgkinson, F. Horowitz, H. A. Macleod, M. Sikkens, and J. J. Wharton
J. Opt. Soc. Am. A 2(10) 1693-1697 (1985)

Optical anisotropy in thin films deposited obliquely: in situ observations and computer modeling

Ian J. Hodgkinson
Appl. Opt. 30(10) 1303-1312 (1991)

Plate-void model for thin-film form birefringence

Kumudini Abeysuriya and Ian J. Hodgkinson
J. Opt. Soc. Am. A 5(9) 1549-1553 (1988)

Anisotropic scatter patterns and anomalous birefringence of obliquely deposited cerium oxide films

Ian Hodgkinson, Sarah Cloughley, Qi Hong Wu, and Samer Kassam
Appl. Opt. 35(28) 5563-5568 (1996)

Scatter from tilted-columnar birefringent thin films: observation and measurement of anisotropic scatter distributions

Ian J. Hodgkinson, Peter I. Bowmar, and Qi hong Wu
Appl. Opt. 34(1) 163-168 (1995)