Abstract

Reflectivities for magnetooptical media are measured as functions of angle of incidence in a series of related experiments. Measurements yield sufficient information to determine absolute magnitude and relative phase for the Fresnel amplitude reflection coefficients, $r_{\Vert }^{(p)}$ and $r_{\Vert }^{(s)}$, as well as for r_⊥, which describes the polar Kerr effect on incident polarized light. Using dielectric tensor values measured at normal incidence, theoretical curves for magnitude and phase of $r_{\Vert }^{(p)},r_{\Vert }^{(s)}$, and r_⊥ vs angle of incidence are developed. Experimental measurements are compared to theoretical functions of the reflectivities and found to be in good agreement throughout the range of angle of incidence. The theoretical analysis and related experimental procedures explicitly treat the presence of a transparent overcoating layer.

© 1986 Optical Society of America

Measurement of the magnetooptical constants of reactive metals

G. A. N. Connell
Appl. Opt. 22(20) 3155-3159 (1983)

Photoelastic modulated ellipsometry on magnetooptic multilayer films

Gerard J. Sprokel
Appl. Opt. 25(22) 4017-4022 (1986)

Use of the 4 × 4 matrix method in the optics of multilayer magnetooptic recording media

Zhan-Ming Li, Brian T. Sullivan, and R. R. Parsons
Appl. Opt. 27(7) 1334-1338 (1988)

Ellipsometric measurement of the Kerr magnetooptic effect

Henry T. Minden
Appl. Opt. 18(6) 813-817 (1979)

Reflectivity, rotation, and ellipticity of magnetooptic film structures

Gerard J. Sprokel
Appl. Opt. 23(22) 3983-3989 (1984)