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Multiple scattering correction in the measurement of particle size and number density by the diffraction method

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Abstract

A ray tracing (or angular flux) method is used to simulate multiple scattering of light by particles on the assumption that the angular distribution function of light scattered by a particle which is illuminated by a plane wave of light is applicable to the case in which a particle is illuminated by a light ray. Numerical results for 1-D slab geometry with azimuthal symmetry show that the measured width of the particle size distribution decreases more rapidly than the measured particle mean size with the number density of the particles, which is consistent with the measurements of particle size much larger than the wavelength of light. A correction increases the equivalent thickness (number density) of the particle phase to that by the x-ray attenuation method. Correction charts for the measurement of particle size distributions are given.

© 1986 Optical Society of America

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