Abstract
The experimental investigation of a high-resolution optical reflectometry technique based on the thermally induced sweep of sample refractive index is described. Reflections from surface scratches and the end surfaces of a Ti:LiNbO3 waveguide were detected with a resolution of <0.2 mm, which is sufficient for the characterization of reflections in integrated-optic devices. Improvement in the dynamic range of the measurement is required for the detection of well-fabricated waveguide features such as bends and Y junctions. Several possibilities exist for making this improvement.
© 1987 Optical Society of America
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