Abstract

We investigate a method of measuring the angular displacement of an aperture when the diffraction pattern rotates. The data that are on a rectangular coordinate are transformed into the data on a polar coordinate. We calculate a cross-correlation function between the diffraction pattern that is rotated and the reference pattern. When the angular displacement is within ±5°, the error is <0.05°. Then, we calculated the angular displacement of the pattern on a spherical coordinate system by personal computer simulation. Consequently, when the azimuth and the elevation of its rotation axis are within ±60°, the error is <0.1°.

© 1987 Optical Society of America

Optical method of measuring angular displacement using a 2-D charge coupled device

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