Abstract

The reflectivities of modified carbon, silicon, and quartz surfaces have been measured from 1 to 25-μm wavelengths. Surfaces were modified by either bombarding carbon surfaces with ∼1000-eV Ar⁺ ions or growing carbon filaments on them by catalytic chemical vapor deposition from hydrocarbon/hydrogen mixtures. The surfaces were highly absorbing through most of this wavelength region with most surfaces showing a rise in reflectivity beyond ∼15 μm. The reflectivity of one modified Si surface was below 1% throughout the entire wavelength region and may be the most highly absorbing surface yet found.

© 1987 Optical Society of America

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