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Polarized light scattering matrix elements for micron-sized rectangular aluminum lines on reflecting optical surfaces

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Abstract

The entire sixteen-element Mueller scattering matrix has been experimentally determined for several small rectangular cross-sectioned aluminum lines whose known dimensions are of the order of the incident light (wavelength λ = 4416 Å). Each line was fabricated on top of a smooth reflecting aluminum surface using electron beam lithography techniques. The Mueller matrix of the surface plus the line was measured as a function of the increasing size (height and width) of the line for various angles of illumination α. The results are compared to scattering and diffraction data from a single slit and opaque circular cylinder of equal dimensions.

© 1987 Optical Society of America

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