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Analysis of the interference pattern in a cross-grating interferometer

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Abstract

A structured source is used to illuminate the four-beam cross-grating interferometer to cause the interference fringes to localize at different planes. When a monochromatic spatially incoherent source is used, the amplitude transmittance of the first cross grating can be imaged to different locations in various planes. With white light extended source illumination, a cross-gratinglike pattern can be formed not only near but also far away from the optical axis simply by choosing four beams of equal path length to interfere. A multicross-grating interferometer is also analyzed with special emphasis on the three-cross-grating interferometer.

© 1988 Optical Society of America

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