Abstract
A system for measuring the ray deflection function and retardation function related to preform birefringence is presented. It enables determination of the refractive-index profile and its anisotropy as well as the stress components within the same cross section of a preform. The system can be easily switched from measurement of the deflection function to measurement of the retardation function by moving a single element. Exemplary results of measurements are given. We note that preform anisotropy induced by stress may bring about additional errors in measurements of the refractive index by nondestructive methods.
© 1988 Optical Society of America
Full Article |
PDF Article
More Like This
References
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription
Cited By
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription
Figures (7)
You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription
Equations (12)
You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription