Abstract

The refractive indices and absorption coefficients of a series of mixed yttria–silica films prepared by electron beam codeposition have been calculated from transmission spectra. The dependence of the refractive index and film densification on composition suggests that porosity inherent in pure yttria films deposited by electron beam evaporation can be reduced by admixture with silica; however, the films show increased absorption which is attributed to oxygen deficiency. These effects are similar to those observed previously in mixed zirconia–silica films.

© 1989 Optical Society of America

Stress reduction in ion beam sputtered mixed oxide films

B. J. Pond, J. I. DeBar, C. K. Carniglia, and T. Raj
Appl. Opt. 28(14) 2800-2805 (1989)

Optical properties and laser damage threshold of HfO₂–SiO₂ mixed composite thin films

Shuvendu Jena, Raj Bahadur Tokas, Nitin M. Kamble, Sudhakar Thakur, and Naba Kishore Sahoo
Appl. Opt. 53(5) 850-860 (2014)

Investigation of the evaporation process conditions on the optical constants of zirconia films

J. A. Dobrowolski, P. D. Grant, R. Simpson, and A. J. Waldorf
Appl. Opt. 28(18) 3997-4005 (1989)

Porosity and optical properties of zirconia films prepared by plasma ion assisted deposition

C. Franke, O. Stenzel, S. Wilbrandt, S. Schröder, L. Coriand, N. Felde, and A. Tünnermann
Appl. Opt. 56(13) 3913-3922 (2017)

Reactively Evaporated Films of Scandia and Yttria

W. Heitmann
Appl. Opt. 12(2) 394-397 (1973)