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Scaling rules for nonlinear thin film optical waveguides

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Abstract

A mode power measure is applied to characterize nonlinear thin film optical waveguides in an approach analogous to that of Chelkowski and Chrostowski. Together with the normalized film thickness and the asymmetry coefficient, it allows us to get a concise overview of the waveguiding properties at a given power. For self-focusing film, we discuss the design conditions under which the degree of asymmetry significantly affects the waveguiding properties.

© 1990 Optical Society of America

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