Cryogenic refractive indices of ZnSe, Ge, and Si at 10.6 μm

Jeffrey M. Hoffman; William L. Wolfe

doi:10.1364/AO.30.004014

Applied Optics
Vol. 30,
Issue 28,
pp. 4014-4016
(1991)
•https://doi.org/10.1364/AO.30.004014

Cryogenic refractive indices of ZnSe, Ge, and Si at 10.6 μm

Jeffrey M. Hoffman and William L. Wolfe

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Jeffrey M. Hoffman and William L. Wolfe, "Cryogenic refractive indices of ZnSe, Ge, and Si at 10.6 μm," Appl. Opt. 30, 4014-4016 (1991)

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Abstract

Refractive-index measurements as a function of temperature have been made for zinc selenide, germanium, and silicon at 10.6 μm over a temperature range of 20–300 K. Each measurement was made by finding the deviation angle of a beam perpendicularly incident on a right triangle prism. The curves for index of refraction versus temperature have been fitted to polynomials, and values for the change in index with temperature are given as a function of temperature.

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Temperature (K)	Measured Value	Fit Value	Residual
20.5	2.38909	2.38907	−0.00002
41.0	2.38946	2.38954	+0.00008
60.0	2.39017	2.39016	−0.00001
79.0	2.39105	2.39093	−0.00012
100.5	2.39186	2.39190	+0.00004
119.0	2.39271	2.39281	+0.00010
140.0	2.39391	2.39389	−0.00002
159.0	2.39491	2.39490	−0.00001
179.0	2.39604	2.39599	−0.00005
199.0	2.39713	2.39711	−0.00002
220.0	2.39823	2.39830	+0.00007
243.0	2.39964	2.39964	−0.00000
261.0	2.40069	2.40069	+0.00000
279.6	2.40181	2.40179	−0.00002
298.5	2.40289	2.40290	+0.00001

Temperature (K)	Measured Value	Fit Value	Residual
20.5	3.92919	3.92910	−0.00009
35.0	3.92972	3.92974	+0.00002
49.5	3.93089	3.93110	+0.00021
65.0	3.93334	3.93323	−0.00011
79.0	3.93571	3.93568	−0.00003
95.0	3.93891	3.93900	+0.00009
110.0	3.94239	3.94254	+0.00015
122.5	3.94594	3.94576	−0.00018
148.5	3.95335	3.95309	−0.00026
166.0	3.95849	3.95841	−0.00008
192.0	3.96646	3.96675	+0.00029
212.0	3.97346	3.97347	+0.00001
238.0	3.98226	3.98258	+0.00032
260.0	3.99090	3.99063	−0.00027
279.5	3.99836	3.99808	−0.00028
298.5	4.00548	4.00570	+0.00022

Temperature (K)	Measured Value	Fit Value	Residual
20.5	3.38973	3.38966	−0.00007
34.5	3.38982	3.38978	−0.00004
49.5	3.39014	3.39013	−0.00001
64.5	3.39057	3.39069	+0.00012
80.0	3.39138	3.39148	+0.00010
94.0	3.39228	3.39237	+0.00009
110.0	3.39357	3.39358	+0.00001
140.0	3.39645	3.39632	−0.00013
163.0	3.39902	3.39879	−0.00023
179.0	3.40069	3.40068	−0.00001
200.0	3.40330	3.40333	+0.00003
220.0	3.40606	3.40601	−0.00005
240.0	3.40855	3.40881	+0.00026
259.5	3.41161	3.41163	+0.00002
279.5	3.41457	3.41458	+0.00001
299.5	2.41765	3.41756	−0.00009

Degree	ZnSe	Ge	Si
0	+2.38890E + 00	+ 3.92959E + 00	+3.38986E + 00
1	−6.77532E − 07	−6.83996E − 05	−2.12218E − 05
2	+4.75471E − 07	+2.28512E − 06	+5.69891E − 07
3	−2.18858E − 09	−6.18370E − 09	−6.35293E − 10
4	+5.29981E – 12	+ 7.2279E − 12	—
5	−4.76910E − 15	—	—
6	−1.02522E − 18	—	—

Temperature (K)	ZnSe	Ge	Si
20	1.6	1.6	0.1
30	2.2	5.3	1.1
40	2.8	8.7	2.1
50	3.3	11.7	3.1
60	3.7	14.5	4.0
70	4.0	17.0	4.9
80	4.3	19.3	5.8
90	4.3	21.4	6.6
100	4.8	23.2	7.4
110	4.9	24.9	8.1
120	5.1	26.3	8.8
130	5.2	27.6	9.5
140	5.2	28.7	10.1
150	5.3	29.7	10.7
160	5.4	30.7	11.2
170	5.5	31.4	11.8
180	5.5	32.2	12.2
190	5.6	32.9	12.7
200	5.6	33.5	13.0
210	5.7	34.1	13.4
220	5.7	34.7	13.7
230	5.8	35.3	14.0
240	5.9	36.0	14.3
250	5.9	36.7	14.4
260	5.9	37.4	14.6
270	5.9	38.2	14.8
280	5.9	39.2	14.9
290	5.9	40.2	14.9
300	5.8	41.4	14.9
—	—	—	—

Sample	Δn at 20 K	Δn at 300 K	Average Δn
ZnSe	0.00045	0.00047	0.00046
Ge	0.00034	0.00096	0.00071
Si	0.00032	0.00047	0.00040

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Applied Optics