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Experimental and theoretical studies on monitored signals from semiconductor diodes undergoing antireflection coatings

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Abstract

Rate equations have been used to analyze the variations of the outputs from the facets of the diodes being coated during the antireflection-coating process. Good agreement between the experimental recordings and theoretical predictions has been achieved. As a result, an auxiliary criterion for on-time assessment of the antireflection coating has been established.

© 1991 Optical Society of America

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