Abstract

This issue of Applied Optics features 36 papers on topics related to particle sizing by optical methods. The contributions to this special issue derive primarily, though not exclusively, from papers presented at the Second International Congress on Optical Particle Sizing held in Tempe, Arizona, on 5–9 March 1990. The congress was the second in what we hope will be a continuing series of international meetings, held at 3-year intervals, on topics related to particle-size measurements by optical techniques. The 1990 Congress built on the successful First International Congress held in Rouen, France, in 1987. A third Congress is planned for 1993 in Yokohama, Japan.

© 1991 Optical Society of America

Optical inspection: introduction by the feature editor

Kristina M. Johnson
Appl. Opt. 27(22) 4613-4614 (1988)

Optical computing: introduction by the feature editors

H. Scott Hinton, Bernard Soffer, Frank A. P. Tooley, and Ken-ichi Yukimatsu
Appl. Opt. 33(8) 1335-1336 (1994)

Optical computing: introduction by the feature editors

B. Keith Jenkins, Sing H. Lee, and C. Lee Giles
Appl. Opt. 31(26) 5423-5425 (1992)

Optical computing: introduction by the feature editors

Bernard Soffer and Sing H. Lee
Appl. Opt. 29(14) 1999-2000 (1990)

Optical properties of mammalian tissue: introduction by the feature editors

Luther E. Preuss and A. Edward Profio
Appl. Opt. 28(12) 2207-2209 (1989)