Abstract

We used phase-conjugate interferometry to determine the optical parameters of absorbing thin films: the refractive index, the extinction coefficient, and the thickness. The use of self-pumped phase-conjugate reflectors in place of mirrors causes optical distortions in the substrate to cancel and makes the interferometer self-aligning. The results of measurement of single-layer absorbing thin films are presented.

© 1991 Optical Society of America

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