Design relationships for acousto-optic scanning systems

A. VanderLugt; A. M. Bardos

doi:10.1364/AO.31.004058

Applied Optics
Vol. 31,
Issue 20,
pp. 4058-4068
(1992)
•https://doi.org/10.1364/AO.31.004058

Design relationships for acousto-optic scanning systems

A. VanderLugt and A. M. Bardos

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A. VanderLugt and A. M. Bardos, "Design relationships for acousto-optic scanning systems," Appl. Opt. 31, 4058-4068 (1992)

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Abstract

We develop the general scanning relationships of an acousto-optic system by using both a purely geometric-optics and a physical-optics approach; each approach provides useful insights into the scanning relationships. The diffraction approach reveals that there are four basic scanning configurations: a long or short chirp scanner, either aperture or repetition-rate limited. The throughput rate for a scanner is always maximized if we use the short-chirp-scanning, repetition-rate-limited mode of operation. The maximum rate may be achieved with other configurations, but at the expense of a decrease in some of the other performance parameters. Examples are given of how these design relationships are used.

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	Long Chirp (T_c ≥ T)		Short Chirp(T_c < T)

Parameter	Aperture Limited (T_c − T ≤ T_r)	Repetition-Rate Limited (T_c − T > T_r)	Aperture Limited (T_c + T_r ≥ T)	Repetition-Rate Limited(T_c + T_r < T)
Active scan time, min(T_s, T_c)	T_c − T	T_c − T	T − T_c	T − T_c
Active aperture time, min(T, T_c)	T	T	T_c	T_c
Scan length (L_s)	$\| \frac{v (T_{c} - T) F}{D - F} \|$	$\| \frac{v T_{r} E}{D - F} \|$	$\| \frac{v (T - T_{c}) F}{D - F} \|$	$\| \frac{v T_{r} F}{D - F} \|$
Spot size (d₀)	$\frac{λ D F}{(D - F) L}$	$\frac{λ D F}{(D - F) L}$	$\frac{λ D F}{(D - F_{c}) L}$	$\frac{λ D F}{(D - F) L_{c}}$
Number of samples per line (M)	(1 − T/T_c)TW	(T_r/_Tc)TW	(1 − T_c/T)TW	(T_r/T)TW
Scan duty cycle [U = min(T_s, T_r,)/T_r]	(T_c − T)T_r	1	(T − T_c)T_r	1
Sample rate (R_s)	(T/T_c)W	(T/T_c)W	W	W
Throughput rate (R_t)	(1 − T/T_c)(T/T_r)W	(T/T_c)W	[(T − T_c)/T_r]W	W

Scanner Type	T (μs)	W (MHz)	T_c	T_r	Throughput Rate	Samples/Scan Line	Location in Fig. 7
Long chirp, aperture limited	50	40	> 40T	T_c	≪ W	≈ TW	P₁
Long chirp, aperture limited	50	40	$\frac{4}{3} T$	$\frac{1}{4} T_{c}$	0.75 W	0.25 TW	P₂
Long chirp, aperture limited	8.3	120	2T	T_c	0.25 W	0.5 TW	P₃
Short chirp, repetition limited	50	30	$\frac{1}{2} T$	T_c	W	0.48 TW	P₄
Short chirp, aperture limited	50	40	$\frac{1}{1.8} T$	T_c	0.875 W	0.43 TW	P₅
Short chirp, repetition limited	50	40	$\frac{1}{2.3} T$	T_c	W	0.43 TW	P₆

	Long Chirp (T_c ≥ T)		Short Chirp(T_c < T)

Parameter	Aperture Limited (T_c − T ≤ T_r)	Repetition-Rate Limited (T_c − T > T_r)	Aperture Limited (T_c + T_r ≥ T)	Repetition-Rate Limited(T_c + T_r < T)
Active scan time, min(T_s, T_c)	T_c − T	T_c − T	T − T_c	T − T_c
Active aperture time, min(T, T_c)	T	T	T_c	T_c
Scan length (L_s)	$\| \frac{v (T_{c} - T) F}{D - F} \|$	$\| \frac{v T_{r} E}{D - F} \|$	$\| \frac{v (T - T_{c}) F}{D - F} \|$	$\| \frac{v T_{r} F}{D - F} \|$
Spot size (d₀)	$\frac{λ D F}{(D - F) L}$	$\frac{λ D F}{(D - F) L}$	$\frac{λ D F}{(D - F_{c}) L}$	$\frac{λ D F}{(D - F) L_{c}}$
Number of samples per line (M)	(1 − T/T_c)TW	(T_r/_Tc)TW	(1 − T_c/T)TW	(T_r/T)TW
Scan duty cycle [U = min(T_s, T_r,)/T_r]	(T_c − T)T_r	1	(T − T_c)T_r	1
Sample rate (R_s)	(T/T_c)W	(T/T_c)W	W	W
Throughput rate (R_t)	(1 − T/T_c)(T/T_r)W	(T/T_c)W	[(T − T_c)/T_r]W	W

Scanner Type	T (μs)	W (MHz)	T_c	T_r	Throughput Rate	Samples/Scan Line	Location in Fig. 7
Long chirp, aperture limited	50	40	> 40T	T_c	≪ W	≈ TW	P₁
Long chirp, aperture limited	50	40	$\frac{4}{3} T$	$\frac{1}{4} T_{c}$	0.75 W	0.25 TW	P₂
Long chirp, aperture limited	8.3	120	2T	T_c	0.25 W	0.5 TW	P₃
Short chirp, repetition limited	50	30	$\frac{1}{2} T$	T_c	W	0.48 TW	P₄
Short chirp, aperture limited	50	40	$\frac{1}{1.8} T$	T_c	0.875 W	0.43 TW	P₅
Short chirp, repetition limited	50	40	$\frac{1}{2.3} T$	T_c	W	0.43 TW	P₆

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Applied Optics