Abstract

We present experimental investigations of two configurations for refractive-index profiling and for geometry measurements of glass-integrated waveguides with the refracted near-field technique. An original configuration is proposed that simplifies the measurement cell and the handling.

© 1992 Optical Society of America

Refracted near-field measurements of refractive index and geometry of silica-on-silicon integrated optical waveguides

Philippe Oberson, Bernard Gisin, Bruno Huttner, and Nicolas Gisin
Appl. Opt. 37(31) 7268-7272 (1998)

New optical configuration for nondestructive measurements of refractive index profiles of LiNbO₃ waveguides

N. Gisin, R. Passy, P. Stamp, N. Hori, and S. Nagano
Appl. Opt. 33(9) 1726-1731 (1994)

Characterization and modeling of planar surface and buried glass waveguides made by field-assisted K⁺ ion exchange

Peter G. Noutsios and Gar Lam Yip
Appl. Opt. 31(25) 5283-5291 (1992)

Optical waveguides fabricated by ion exchange in high-index commercial glasses

Jens Johansson, Gnon Djanta, and Jean-Louis Coutaz
Appl. Opt. 31(15) 2796-2799 (1992)

Improved propagation-mode near-field method for refractive-index profiling of optical waveguides

G. L. Yip, P. C. Noutsios, and L. Chen
Appl. Opt. 35(12) 2060-2068 (1996)