Abstract

An optical configuration is suggested that will achieve a twofold increase in sensitivity when one measures an in-plane displacement component of a deformation vector compared with the Leendertz two-beam illumination method. A theory and experimental demonstration of the method are presented.

© 1993 Optical Society of America

Fringe formation in an in-plane displacement measurement configuration with twofold increase in sensitivity: theory and experiment

T. Santhanakrishnan, P. K. Palanisamy, and R. S. Sirohi
Appl. Opt. 37(19) 4150-4153 (1998)

Optical configuration in speckle shear interferometry for slope change contouring with a twofold increase in sensitivity

T. Santhanakrishnan, P. K. Palanisamy, and R. S. Sirohi
Appl. Opt. 37(16) 3447-3449 (1998)

Spatial phase shifting for pure in-plane displacement and displacement-derivative measurements in electronic speckle pattern interferometry (ESPI)

R. S. Sirohi, J. Burke, H. Helmers, and K. D. Hinsch
Appl. Opt. 36(23) 5787-5791 (1997)

Increased sensitivity to in-plane displacements in electronic speckle pattern interferometry

C. Joenathan, A. Sohmer, and L. Bürkle
Appl. Opt. 34(16) 2880-2885 (1995)

Speckle interferometric methods of measuring small out-of-plane displacements

R. K. Mohanty, C. Joenathan, and R. S. Sirohi
Opt. Lett. 9(11) 475-477 (1984)