Abstract

The index of refraction of a-Si_1−xC_x:H thin films obtained by dc magnetron sputtering was determined by means of IR absorption measurements. Structural and compositional changes that take place by increasing x make the film a mixture of different species, giving an effective value of the refractive index.

© 1993 Optical Society of America

Imaginary refractive index of buckyballs

James D. Lindberg, Rex E. Douglass, and Dennis M. Garvey
Appl. Opt. 32(21) 3921-3922 (1993)

Dark spatial solitons in bacteriorhodopsin thin films

P. S. Ramanujam and Lars R. Lindvold
Appl. Opt. 32(33) 6656-6658 (1993)

Immersion grating for infrared astronomy

Günter Wiedemann and Donald E. Jennings
Appl. Opt. 32(7) 1176-1178 (1993)

Automatic interference method for measuring transparent film thickness

A. González-Cano and E. Bernabéu
Appl. Opt. 32(13) 2292-2294 (1993)

Mid-IR absorption in AgGaSe₂ optical parametric oscillator crystals

G. C. Catella, L. R. Shiozawa, J. R. Hietanen, R. C. Eckardt, R. K. Route, R. S. Feigelson, D. G. Cooper, and C. L. Marquardt
Appl. Opt. 32(21) 3948-3951 (1993)