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Soft-x-ray damage to p-terphenyl coatings for detectors

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Abstract

The organic phosphor p-terphenyl is used as a wavelength-converter coating in some soft-x-ray detectors. We have measured the absolute photoluminescent efficiency of p-terphenyl as a function of incident photon energy from 36 to 191 eV. We have also measured changes in the efficiency caused by soft-x-ray fluence (total photons absorbed per unit area) at several photon energies in this range. We find that efficiency drops rapidly as a function of fluence, with the rate of decrease increasing with higher soft x-ray energies.

© 1994 Optical Society of America

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