Abstract

We present the use of multiwavelength combination sources in a direct method for improved central fringe identification in a white-light interferometric system. The optimum wavelength combinations of such sources can be obtained by the use of the results of a simple analysis. We find that this multiwavelength technique can greatly reduce the minimum signal-to-noise ratio required by the system when used to identify the central fringe, and thus it offers an increased signal resolution. As a result, it is suitable for high-precision measurement purposes as well as for applications in coherence multiplexed interferometric sensor systems.

© 1994 Optical Society of America

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