Abstract

The refractive index and the thickness of a transparent pellicle are determined when the pellicle is placed between two vertical crossed polarizers and rotated in the horizontal plane. The transmission axes of the polarizers are neither parallel nor perpendicular to the plane of incidence. The light transmitted through the crossed polarizers reaches a minimum when the pellicle satisfies the absentee-layer condition. The refractive index and the film thickness are obtained from the pellicle orientation angles under such a condition.

© 1996 Optical Society of America

Refractive index and geometrical thickness measurement of a transparent pellicle in air by Gaussian beam defocusing

Octavio Olvera-R, Moisés Cywiak, Joel Cervantes-L, and Arquímedes Morales
Appl. Opt. 53(11) 2267-2272 (2014)

Optical interference method for the approximate determination of refractive index and thickness of a transparent layer

Alvin M. Goodman
Appl. Opt. 17(17) 2779-2787 (1978)

Simultaneous measurement of refractive index and thickness of thin film by polarized reflectances

Tami Kihara and Kiyoshi Yokomori
Appl. Opt. 29(34) 5069-5073 (1990)

Determination of refractive index and thickness of thick transparent films by variable-angle spectroscopic ellipsometry: application to benzocyclobutene films

Shuwen Guo, Göran Gustafsson, Olle Jonny Hagel, and Hans Arwin
Appl. Opt. 35(10) 1693-1699 (1996)

Figure of merit enhancement of surface plasmon resonance sensors using absentee layer

Zhaoyang Chen, Xin Zhao, Chengyou Lin, Shujing Chen, Liang Yin, and Yingchun Ding
Appl. Opt. 55(25) 6832-6835 (2016)