Abstract

We present a nondestructive experimental method to measure monotonically varying refractive-index profiles of planar waveguides. The technique is a modification of the Lloyd's mirage setup proposed by Allman et al. [Appl. Opt. 33, 1806 (1994)] in order to have a reference phase distribution for the interference pattern. The theoretical calculations have been implemented to account for multiple reflections inside the sample. An application of the method to ion-exchanged glass waveguides is reported.

© 1996 Optical Society of America

Refractive-index-profile determinations by using Lloyd’s mirage

B. E. Allman, A. G. Klein, K. A. Nugent, and G. I. Opat
Appl. Opt. 33(10) 1806-1811 (1994)

Graded-index profiles by inversion with Lloyd's mirage

L. J. Allen and R. Lipperheide
Appl. Opt. 35(19) 3496-3499 (1996)

Refractive-index profiling of planar gradient-index waveguides by phase-measuring microinterferometry

Matgorzata Sochacka, Elena Lopez Lago, and Zbigniew Jaroszewicz
Appl. Opt. 33(16) 3342-3347 (1994)

Accurate method for determining the refractive-index profiles of planar waveguides in uniaxial media with the optical axis normal to the surface

Jesper Falden Offersgaard, Torben Veng, and Torben Skettrup
Appl. Opt. 35(15) 2602-2609 (1996)

Improved propagation-mode near-field method for refractive-index profiling of optical waveguides

G. L. Yip, P. C. Noutsios, and L. Chen
Appl. Opt. 35(12) 2060-2068 (1996)