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Beam Cone Analysis for the Beams Non-paraxially Input to Dielectric Boundaries

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Abstract

Directional variation of the acceptance angle of angled-endface fibers is studied by the use of a simple vectorial method. By the same method, beam cones are studied in a photodiode substrate after the beam is input with inclination, as in the case of an InP-based photodiode mounted on a silicon v-groove with an optical fiber. The same method can also be applied to the determination of beam cone shapes in prisms.

© 1996 Optical Society of America

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