Abstract

A new algorithm to reveal the order and sign of fringes formed by dual-beam electronic speckle-pattern interferometry is described. When combined with a previously reported phase-extraction method, it makes possible the evaluation of displacement absolutely and continuously over the entire surface of the object from a total of five frames. This technique is particularly useful when displacement is spatially discontinuous and temporally fast and the amount of data is large. A model experiment showing the validity of this method is presented.

© 1997 Optical Society of America

Simultaneous measurement of three orthogonal components of displacement by electronic speckle-pattern interferometry and the Fourier transform method

T. Takatsuji, B. F. Oreb, D. I. Farrant, and J. R. Tyrer
Appl. Opt. 36(7) 1438-1445 (1997)

Contouring by electronic speckle pattern interferometry employing dual beam illumination

Charles Joenathan, Berthold Pfister, and H. J. Tiziani
Appl. Opt. 29(13) 1905-1911 (1990)

Spatial phase shifting in electronic speckle pattern interferometry: minimization of phase reconstruction errors

Thorsten Bothe, Jan Burke, and Heinz Helmers
Appl. Opt. 36(22) 5310-5316 (1997)

Spatial phase shifting for pure in-plane displacement and displacement-derivative measurements in electronic speckle pattern interferometry (ESPI)

R. S. Sirohi, J. Burke, H. Helmers, and K. D. Hinsch
Appl. Opt. 36(23) 5787-5791 (1997)

Phase extraction from electronic speckle pattern interferometry addition fringes

Andrew J. Moore, John R. Tyrer, and Fernando Mendoza Santoyo
Appl. Opt. 33(31) 7312-7320 (1994)