Abstract

The extended Jones matrix method is applied to one dielectrically anisotropic, homogeneous thin film at oblique incidence. Standard boundary conditions are imposed on resultant electric- and magnetic-field vectors at interfaces. Thus simple matricial relations are obtained for transmitted and reflected electric-field amplitudes at the two interfaces. In the limits of isotropy, they reduce to four well-known Abelès relations, and thus they may be considered as generalized Abelès relations for dielectrically anisotropic thin films. These matricial relations include multiple reflections while dealing with total fields. Thus they provide new insights into the 2 × 2 extended Jones matrix formalism.

© 1997 Optical Society of America

Generalized Abelès relations for an anisotropic thin film with an arbitrary dielectric tensor: comments

Flavio Horowitz
Appl. Opt. 37(19) 4268-4269 (1998)

Simple recurrence matrix relations for multilayer anisotropic thin films

E. Cojocaru
Appl. Opt. 39(1) 141-148 (2000)

Direction cosines and vectorial relations for extraordinary-wave propagation in uniaxial media

E. Cojocaru
Appl. Opt. 36(1) 302-306 (1997)

Ellipsometry of anisotropic thin films

D. J. De Smet
J. Opt. Soc. Am. 64(5) 631-638 (1974)

Matrix description of coherent and incoherent light reflection and transmission by anisotropic multilayer structures

Kamil Postava, Tomuo Yamaguchi, and Roman Kantor
Appl. Opt. 41(13) 2521-2531 (2002)