Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

In situ surface monitoring system for synchrotron mirrors under high heat load

Not Accessible

Your library or personal account may give you access

Abstract

A portable electro-optical system capable of real-time measurements of surface slope distortions down to 0.5 µrad is described; the system is limited primarily by its short-term stability. The system employs an angle measurement technique that, in combination with the least-squares signal extraction method, reduces system fluctuations. In addition, a multireflection technique is used to enhance the detectable resolution. Although designed for use with mirrors for synchrotron radiation sources, this system has the flexibility to be applied to other optical components. The prototype system has been tested on a sample mirror piece, and preliminary results are presented. A brief discussion about the extension of this metrology unit to adaptive optics is also given.

© 1997 Optical Society of America

Full Article  |  PDF Article
More Like This
Precise measuring method for detecting the in situ distortion profile of a high-heat-load mirror for synchrotron radiation by use of a pentaprism long trace profiler

Shinan Qian, Werner Jark, Giovanni Sostero, Alessandro Gambitta, Fabio Mazzolini, and Adolfo Savoia
Appl. Opt. 36(16) 3769-3775 (1997)

Surface analysis of an actively controlled telescope primary mirror under static loads

Frank B. Ray and Yung-Tseng Chung
Appl. Opt. 24(4) 564-569 (1985)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Figures (6)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Equations (2)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.