Abstract
An optoelectronic implementation of the nonlinear morphological
correlation by use of a threshold-decomposition technique and a joint
transform correlator architecture is presented. This nonlinear
morphological correlation provides improved image detection compared
with standard linear optical pattern-recognition correlation
methods. It also offers a more robust detection of low-intensity
images in the presence of high-intensity patterns to be
rejected.
© 1998 Optical Society of America
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