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Simple expressions for transmission and reflection matrix elements of a biaxial thin layer at normal incidence

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Abstract

The extended Jones matrix method is applied for determination of the transmission and reflection matrices for a normally incident plane wave upon an homogeneous and lossless biaxial thin layer. The elements of these matrices are expressed by simple analytical relations. By using these relations one can express analytically the polarization-dependent optical parameters to be determined by generalized ellipsometry.

© 1999 Optical Society of America

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Equations (24)

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