Abstract

We describe a method of measuring the relative optical phase on reflection between amorphous and crystalline regions of the phase-change media of optical data storage. With a red He–Ne laser (wavelength, 632.8 nm) the relative phases on two quadrilayer optical disk stacks were measured and found to be ∼40°. The results are in good agreement with the calculated values based on the known layer thicknesses and refractive indices of the stacks. For calibration purposes the height of a known step on an otherwise flat silicon substrate was measured with the same apparatus. The proposed method is fairly simple to set up, can measure both front-surface and through-substrate types of optical disk, and can be used with any laser that has long coherence length.

© 2000 Optical Society of America

Measurement of the thermal conductivity of erasable phase-change optical recording media

Chubing Peng and M. Mansuripur
Appl. Opt. 39(14) 2347-2352 (2000)

Amorphization induced by subnanosecond laser pulses in phase-change optical recording media

Chubing Peng and Masud Mansuripur
Appl. Opt. 43(22) 4367-4375 (2004)

Measurement of the thermal coefficients of rewritable phase-change optical recording media

Chubing Peng and Masud Mansuripur
Appl. Opt. 41(2) 361-369 (2002)

Polarization dependence of readout signals from periodic one-dimensional arrays of magnetic domains in magneto-optical media and crystalline-amorphous line pairs in phase-change media of optical recording

Rongguang Liang, Lifeng Li, Kimihiro Saito, and Masud Mansuripur
Appl. Opt. 40(14) 2323-2330 (2001)

Crystallization and amorphization studies of a Ge₂Sb_2.3Te₅ thin-film sample under pulsed laser irradiation

Pramod K. Khulbe, Xiaodong Xun, and M. Mansuripur
Appl. Opt. 39(14) 2359-2366 (2000)