Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Speckle interferometry: three-dimensional deformation field measurement with a single interferogram

Not Accessible

Your library or personal account may give you access

Abstract

An electronic speckle interferometer, arranged for out-of-plane sensitivity and with an off-axis reference beam to produce spatial phase bias, is used for three-dimensional deformation field measurements. The complex amplitude of the object wave is calculated by application of a Fourier-transform method to a single interferogram. The change in phase after object deformation yields the out-of-plane component of the displacement field. The two in-plane components are obtained by cross correlation of subimages of the reconstructed object wave’s intensity, a method that is also referred to as digital speckle photography. The Fourier-transform algorithm is extended and modified, leading to random measurement errors that are below widely accepted theoretical limits and also to an extended measuring range. These properties and the mutually combined information improve the accuracy of both methods compared with their usual single implementation. The performance is evaluated in experiments with pure out-of-plane, pure in-plane, and combined deformations and compared with theoretical values. An example of a practical application is given.

© 2001 Optical Society of America

Full Article  |  PDF Article
More Like This
Three-dimensional deformation field measurement with digital speckle correlation

Thomas Fricke-Begemann
Appl. Opt. 42(34) 6783-6796 (2003)

Three-wavelength electronic speckle pattern interferometry with the Fourier-transform method for simultaneous measurement of microstructure-scale deformations in three dimensions

Eric B. Flynn, Lori C. Bassman, Timothy P. Smith, Zamir Lalji, Laurel H. Fullerton, Tommy C. Leung, Scott R. Greenfield, and Aaron C. Koskelo
Appl. Opt. 45(14) 3218-3225 (2006)

Full-field 3D deformation measurement: comparison between speckle phase and displacement evaluation

Davood Khodadad, Alok Kumar Singh, Giancarlo Pedrini, and Mikael Sjödahl
Appl. Opt. 55(27) 7735-7743 (2016)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Figures (16)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Equations (16)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved