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n/∂T measurements performed with guided waves and their application to the temperature sensitivity of wavelength-division multiplexing filters

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Abstract

Measurements of ∂n/∂T of thin films by the m-lines technique are presented. The importance of the substrate material is shown. An example of the wavelength shift of an optical thin-film filter with temperature is studied both theoretically and experimentally. The theoretical wavelength shift of a dense wavelength-division multiplexing filter is discussed.

© 2002 Optical Society of America

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