Abstract

Engineers designing optical alignment servo systems for Michelson interferometers and Fourier-transform infrared spectrometers need to predict the amount of noise expected from the small and randomly varying amounts of misalignment that occur as the servo attempts to maintain alignment while taking data. A formula is derived for the noise-equivalent change in radiance due to this effect and the formula’s accuracy is demonstrated by comparison of its predictions to the errors found in simulated interferometer measurements contaminated by misalignment noise.

© 2003 Optical Society of America

Noise-equivalent change in radiance for sampling noise in a double-sided interferogram

Douglas L. Cohen
Appl. Opt. 42(13) 2289-2300 (2003)

Noise-equivalent change in radiance for misalignment noise in a double-sided interferogram: erratum

Douglas L. Cohen
Appl. Opt. 43(6) 1221-1222 (2004)

Performance degradation of a Michelson interferometer when its misalignment angle is a rapidly varying, random time series

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Performance degradation of a Michelson interferometer due to random sampling errors

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SI traceable algorithm for characterizing hyperspectral infrared sounder CrIS noise

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