Abstract
We analyze two basic aspects of a scanning near-field optical microscope (SNOM) probe's operation: (i) spot-size evolution of the electric field along the probe with and without a metal layer, and (ii) a modal analysis of the SNOM probe, particularly in close proximity to the aperture. A slab waveguide model is utilized to minimize the analytical complexity, yet provides useful quantitative results—including losses associated with the metal coating—which can then be used as design rules.
© 2006 Optical Society of America
Full Article | PDF ArticleMore Like This
Peter Moar, François Ladouceur, and Laurie Cahill
Appl. Opt. 39(12) 1966-1972 (2000)
Patrick Lambelet, Abdeljalil Sayah, Michael Pfeffer, Claude Philipona, and Fabienne Marquis-Weible
Appl. Opt. 37(31) 7289-7292 (1998)
Gregor Schürmann, Wilfried Noell, Urs Staufer, Nico F. de Rooij, Rolf Eckert, Jan M. Freyland, and Harry Heinzelmann
Appl. Opt. 40(28) 5040-5045 (2001)